Empleyee publications

Zdjęcie Authors Title Year Journal/Book Actions
Okładka czasopisma Mateusz Tobiszewski, Artur Zieliński, Kazimierz Darowicki Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact 2014 MICROSCOPY AND MICROANALYSIS. -Vol. 20., iss. 1 (2014), s.72-77 Details
Okładka czasopisma Artur Zieliński, Kazimierz Darowicki Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode. 2014 MICROSCOPY AND MICROANALYSIS. -Vol. 20., (2014), s.974-981 Details
Okładka czasopisma Artur Zieliński, Robert Bogdanowicz, Jacek Ryl, Łukasz Burczyk, Kazimierz Darowicki Local impedance imaging of boron-doped polycrystalline diamond thin films. PREPRINT 2014 APPLIED PHYSICS LETTERS. -Vol. 105., (2014), Details
Okładka czasopisma Jacek Ryl, Joanna Wysocka, Magdalena Jarzynka, Artur Zieliński, Juliusz Orlikowski, Kazimierz Darowicki Effect of native air-formed oxidation on the corrosion behavior of AA7075 aluminum alloys 2014 CORROSION SCIENCE. -Vol. 87., (2014), s.150-155 Details
Okładka czasopisma Anna Arutunow, Artur Zieliński, Mateusz Tobiszewski Localized impedance measurements of AA2024 and AA2024-T3 performed by means of AFM in contact mode 2013 ANTI-CORROSION METHODS AND MATERIALS. -Vol. 60., iss. 2 (2013), s.67-72 Details
Okładka czasopisma Kazimierz Darowicki, Artur Zieliński, Jacek Ryl, Paweł Ślepski Impedance of cation-coupled electron transfer reaction: Theoretical description of one pathway process 2013 ELECTROCHIMICA ACTA. -Vol. 87., (2013), s.930-939 Details
Okładka czasopisma Aleksandra Fabiańska, Robert Bogdanowicz, Patrycja Zięba, Tadeusz Ossowski, Marcin Gnyba, Jacek Ryl, Artur Zieliński, Stoffel D. Janssens, Ken Haenen, Ewa Siedlecka Electrochemical oxidation of sulphamerazine at boron-doped diamond electrodes: Influence of boron concentration 2013 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. -Vol. 210., iss. 10 (2013), s.2040-2047 Details
Okładka czasopisma Sylwia Babicz-Kiewlicz, Artur Zieliński, Janusz Smulko Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis 2013 Bulletin of the Polish Academy of Sciences-Technical Sciences. -Vol. 61., iss. 2 (2013), s.535-539 Details
Okładka czasopisma Marek Kiwilszo, Artur Zieliński, Janusz Smulko, Kazimierz Darowicki Improving AFM images with harmonic interference by spectral analysis 2012 MICROSCOPY AND MICROANALYSIS. -Vol. 18., nr. Iss. 1 (2012), s.186-195 Details
Okładka czasopisma Anna Arutunow, Kazimierz Darowicki, Artur Zieliński Atomic force microscopy based approach to local impedance measurements of grain interiors and grain boundaries of sensitized AISI 304 stanless steel 2011 ELECTROCHIMICA ACTA. -Vol. 56., nr. iss. 5 (2011), s.2372-2377 Details
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