| Title | Ellipsometric investigation of nitrogen doped diamond thin films grown in microwave CH4/H2/N2 plasma enhanced chemical vapor deposition |
| Authors | Mateusz Ficek, Kamatchi J Sankaran, Jacek Ryl, Robert Bogdanowicz, I-Nan Lin, Ken Haenen, Kazimierz Darowicki |
| Publishing house | APPLIED PHYSICS LETTERS. -Vol. 108, (2016), s.1-5 |
| Publication year | 2016 |
| Zasoby |
2016 JOURNAL OF ELECTROANALYTICAL CHEMISTRY. -Vol. 778, (2016), s.126-136 Joanna Wysocka, Stefan Krakowiak, Jacek Ryl, Kazimierz Darowicki
2016 CARBON. -Vol. 96., (2016), s.1093-1105 Jacek Ryl, Łukasz Burczyk, Robert Bogdanowicz, Michał Sobaszek, Kazimierz Darowicki
2016 ELECTROANALYSIS. -Vol. 28, iss. 1 (2016), s.211-221 P. Niedzia¸kowski, Robert Bogdanowicz, Patrycja Zi«ba, Joanna Wysocka, Jacek Ryl, Micha¸ Sobaszek, Tadeusz Ossowski
2016 INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH. -Vol. 55, iss. 36 (2016), s.9614-9624 Husnu Gerengi, Micha¸ Mielniczek, Gškhan Gece, Moses Solomon
2016 ANTI-CORROSION METHODS AND MATERIALS. -Vol. 63, iss. 4 (2016), s.289-294 Micha¸ SzociÄski