dr hab. inż., prof. PG -
Research and didactical Staff
Details of the employee
Announcements - ( Show all news )
| Date of creation | Employee | Title | Files | Actions |
| 2014-09-26 11:21:38 | Artur Zieliński | Ogłoszenie | Details |
Publications - ( Show all publications )
| Zdjęcie | Authors | Title | Year | Journal/Book | Actions |
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Mateusz Tobiszewski, Artur Zieliński, Kazimierz Darowicki | Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact | 2014 | MICROSCOPY AND MICROANALYSIS. -Vol. 20., iss. 1 (2014), s.72-77 | Details |
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Jacek Ryl, Joanna Wysocka, Magdalena Jarzynka, Artur Zieliński, Juliusz Orlikowski, Kazimierz Darowicki | Effect of native air-formed oxidation on the corrosion behavior of AA7075 aluminum alloys | 2014 | CORROSION SCIENCE. -Vol. 87., (2014), s.150-155 | Details |
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Artur Zieliński, Robert Bogdanowicz, Jacek Ryl, Łukasz Burczyk, Kazimierz Darowicki | Local impedance imaging of boron-doped polycrystalline diamond thin films. PREPRINT | 2014 | APPLIED PHYSICS LETTERS. -Vol. 105., (2014), | Details |
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Artur Zieliński, Kazimierz Darowicki | Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode. | 2014 | MICROSCOPY AND MICROANALYSIS. -Vol. 20., (2014), s.974-981 | Details |
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Anna Arutunow, Artur Zieliński, Mateusz Tobiszewski | Localized impedance measurements of AA2024 and AA2024-T3 performed by means of AFM in contact mode | 2013 | ANTI-CORROSION METHODS AND MATERIALS. -Vol. 60., iss. 2 (2013), s.67-72 | Details |
Courses
| Name | Field of study | Semestr | St. studiów | Employee | Actions |
| Miernictwo cyfrowe II | Inżynieria Materiałowa | semestr II | II stopień | Artur Zieliński | |
| Miernictwo cyfrowe | Inżynieria Materiałowa | semestr V | I stopień | Artur Zieliński | |
| Miernictwo Korozyjne | Technologia Chemiczna | semestr VII | I stopień | Artur Zieliński | |
| Elektrochemiczne techniki pomiarowe | Inżynieria Materiałowa | semestr I | II stopień | Artur Zieliński | |
| Miernictwo | Chemia | semestr V | I stopień | Artur Zieliński | |
| Nanoskopowa Analiza Powierzchni | Technologia Chemiczna | semestr II | II stopień | Artur Zieliński |
Achievements - ( Show all achievements )
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